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Hyperspectral Nanomotion Microscopy

By Tongjun Liu and others
We have developed a technique that extends static scanning electron microscopic imaging to include hyperspectral mapping of fast thermal and externally-driven movements at up to Megahertz frequencies. It is based on spectral analysis of the secondary electron flux generated by a focused electron beam incident on the moving object. We... Show more
May 12, 2020
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Hyperspectral Nanomotion Microscopy
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