Sign in

High-resolution ab initio three-dimensional X-ray diffraction microscopy

By H. Chapman and others
Coherent X-ray diffraction microscopy is a method of imaging non-periodic isolated objects at resolutions only limited, in principle, by the largest scattering angles recorded. We demonstrate X-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are... Show more
September 8, 2005
=
0
Loading PDF…
Loading full text...
Similar articles
Loading recommendations...
=
0
x1
High-resolution ab initio three-dimensional X-ray diffraction microscopy
Click on play to start listening