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Electrostatic Landscape of a H-Silicon Surface Probed by a Moveable Quantum Dot

By Taleana Huff and others
With nanoelectronics reaching the limit of atom-sized devices, it has become critical to examine how irregularities in the local environment can affect device functionality. Here, we characterize the influence of charged atomic species on the electrostatic potential of a semiconductor surface at the sub-nanometer scale. Using non-contact atomic force microscopy,... Show more
June 17, 2019
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Electrostatic Landscape of a H-Silicon Surface Probed by a Moveable Quantum Dot
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